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LISTING DETAILS
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Industry >
Machinery Equipment |
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Tester HP4145B Semiconductor Parameter Analyzer from Allwin21 Corp. |
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HP 4062UX HP 4145B HP 4145A HP 4155 HP 4085B HP 4142B
Probe/Tester:
(1)EG 1034 (2)EG 2001 (3)EG 2010 (4)HP 4062 (5)HP 4145B (6)HP 4142B (7)HP 4155
(8)HP 4084B (9)HP 4085B
http://www.allwin21.com
peterchen@allwin21.com Phone: 001-408-988-5188 Peter Chen
Displayed information--measurement setups, auto-sequence pro-
grams, measurement results--can be dumped directly onto an ex-
ternal graphics plotter to obtain publication-quality hard copies. A
built-in 3-~-inch disk drive enables you to store measurement setups
and measured data, which can be accessed by another compatible HP
disk drive for further processing.
Auto Sequence Programs
Measurement programs stored on a HP 4145B 3~-inch disk can be
linked by an auto-sequence program, making it possible to perform a
series of measurements with just one keystroke.
Four Oser-Selectable Display Formats to Suit the
Evaluation
Measurement results can be displayed in one of four display for-
mats: Graphics, list, matrix, or schmoo. After measurement has been
made and the results displayed, the softkeys can be used to access
various analysis functions for complete device evaluation. These
functions include MARKER for numeric readout of measured value
at any point along a plotted curve, CURSOR for numeric readout of
value at any graphic point and for line positioning, STORE/RE-
CALL for overlay comparisons, AUTO SCALE for optimum graphic
scaling, and LINE FUNCTION for direct readout of line gradient
and X-Y axis intercept values.
Designed for production-line and laboratory use, the HP4145B is the electronics industry's first standalone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage-and current-sensitive devices, measures the resulting current and voltage responses, and displays the results in a user-selectable format (graph, list, matrix, or schmoo) on a built-in CRT display. An on-board programmable calculator provides real-time calculation of voltage/current-dependent parameters, such as the current gain (HFE) and transconductance(gm) of transistors, which can also be displayed on the CRT. A number of powerful graphic analysis tools--marker, cursor, line function, and interpolation--enhance the HP 4145B's basic capabilities and provide fast, accurate analysis of semiconductor devices, leading to increased production yields and improved device quality.
Four built-in source monitor units (SMUs) are the heart of the HP 4145B. Each SMU can be independently programmed to function as either a voltage source/current monitor or a current source/voltage monitor. Thus a bipolar transistor, for example, can be completely characterized in common-base, common-emitter, and common-collector configurations without changing connectionsoonly changing the SMU’s operating modes is required. The HP 4145B is also equipped with 2 voltage sources and 2 voltage monitors for measurements on devices having more than 4 terminals, such as ICs. The HP4145B can be controlled from the front panel via the HP-IB (standard), or by measurement setups stored on diskettes.
Displayed information--measurement setups, auto-sequence programs, and measurement results can be dumped directly onto an external graphics plotter to obtain publication quality hard copies. A built-in 3”inch disk drive enables you to store measurement setups and measured data, which can be accessed by another compatible HP disk drive for further processing.
HP4145B Parameter Analyzer key features:
? Fully automatic, high-peed dc characterization of semiconductor devices
? High-resolution, wide-range sourcing and measurement
I: 50 fA to 100 mA; V: 1 mV to 100 V
? Maximum 1140 measurement and display points for precise measurement and analysis
? Flexible graphic analysis functions for quick parameter extraction
? Built-in 3-inch disk drive for storage of 240 user programs or 105 measurement results
Allwin21 Corp. focus on the following tools Semiconductor Equipments :
Rapid Thermal Process/Annealing:
(1)Upgraded AG 210 (2)Upgraded AG 410 (3)Upgraded AG 610(AccuThermo AW 610).
(4)Upgraded AG 4100 (5)Upgraded AG 4100S (6)Upgraded AG 4108 (7)Upgraded AG 8108
(8)Upgraded AG 8800
Plasma Etch/Asher/Descum:
(1)Upgraded Matrix 105 (2)Upgraded Matrix 205 (3)Upgraded Matrix 303 (4)Upgraded Matrix 403(5)Upgraded Tegal 901 (6)Upgraded Tegal 903 (7)Upgraded Tegal 901e(8)Upgraded Tegal 903e (9)Upgraded Gasonics AE 2001 (10)Upgraded Gasonics Aura 1000 (11)Upgraded Gasonics Aura 3010 (12)Upgraded Gasonics PEP 3510 (13)Upgraded Branson IPC 3000
PECVD/RIE/ICP:
(1)STS 310 (2)STS 320 (3)Plasma Thermal 700 720 (4)Plasma Thermal 790
Probe/Tester:
(1)EG 1034 (2)EG 2001 (3)EG 2010 (4)HP 4062 (5)HP 4145B (6)HP 4142B (7)HP 4155
(8)HP 4084B (9)HP 4085B
http://www.allwin21.com
peterchen@allwin21.com Phone: 001-408-988-5188 Peter Chen
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Location: |
Santa Clara, California, USA |
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Contact
Person:
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yanhongtan |
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Phone: |
001-408-988-5188 |
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